Tabletop X-ray crystal orientation measurement device SDCOM
Compact and high-performance Smart X-ray Orientation
●High-speed measurement in just 10 seconds ●Top illumination type ●Various optical system options ●Compatible with ingot and wafer inspection ●Measurement orientation adjustment mechanism
- Company:スペクトリス株式会社 マルバーン・パナリティカル事業部
- Price:50 million yen-100 million yen